56 reviews for 'Instrumentation'
Click to go to journal page | Average duration | Review reports (1st review rnd.) |
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Journal title | 1st rev. rnd | Tot. handling | Im. rejection | Number | Quality | Difficulty | Review rounds | Overall rating | # ⬇ | ||
Sensors and Actuators, B: Chemical | 7.1 months |
7.4 months |
7.5 days |
3.2 | 3.4 | 2.3 | 1.6 | 3.0 (good) |
7 » | ||
IEEE Sensors Journal | 1.9 months |
2.7 months |
n/a | 2.4 | 3.7 | 4.0 | 1.6 | 3.7 (very good) |
7 » | ||
Thermochimica Acta | 1.5 months |
2.5 months |
1.5 days |
2.0 | 2.3 | 1.7 | 1.8 | 2.5 (good) |
6 » | ||
ISA Transactions | 5.8 months |
11.6 months |
n/a | 3.2 | 2.0 | 2.5 | 1.3 | 2.2 (moderate) |
6 » | ||
Measurement | 3.0 months |
3.8 months |
94.5 days |
2.3 | 3.3 | 3.0 | 1.3 | 3.3 (good) |
5 » | ||
Physical Review Accelerators and Beams | 2.4 months |
3.5 months |
n/a | 2.0 | 4.0 | 4.3 | 3.0 | 4.0 (very good) |
3 » | ||
Spectrochimica Acta, Part A: Molecular and Biomolecular Spectroscopy | 1.9 months |
2.0 months |
4.0 days |
2.0 | 3.5 | 3.0 | 1.5 | 3.5 (very good) |
3 » | ||
Hydrological Processes | 1.7 months |
3.8 months |
30.4 days |
2.0 | 3.0 | 3.0 | 2.0 | 3.0 (good) |
2 » | ||
Transactions of the Institute of Measurement and Control | 1.6 months |
11.6 months |
n/a | 2.5 | 3.0 | 5.0 | 2.0 | 3.5 (very good) |
2 » | ||
Review of Scientific Instruments | 2.3 months |
3.6 months |
n/a | 2.0 | 3.5 | 1.5 | 2.5 | 2.5 (good) |
2 » | ||
Ultramicroscopy | 5.2 months |
6.5 months |
n/a | 1.5 | 3.0 | 4.0 | 1.5 | 2.5 (good) |
2 » | ||
Mechanics of Materials | n/a | n/a | 10.5 days |
n/a | n/a | n/a | n/a | n/a | 2 » | ||
Microscopy and Microanalysis | 1.0 months |
2.3 months |
n/a | 2.0 | 4.0 | 3.0 | 2.0 | 4.0 (very good) |
1 » | ||
Measurement Science and Technology | 0.2 months |
0.2 months |
n/a | 2.0 | 4.0 | n/a | 1.0 | 4.0 (very good) |
1 » | ||
Radiation Measurements | 2.4 months |
3.6 months |
n/a | 2.0 | 4.0 | 3.0 | 2.0 | 5.0 (excellent) |
1 » | ||
International Journal of Mass Spectrometry | 1.6 months |
2.1 months |
n/a | 2.0 | 4.0 | 5.0 | 2.0 | 3.0 (good) |
1 » | ||
Radio Science | 1.8 months |
3.3 months |
n/a | 3.0 | 4.0 | 4.0 | 3.0 | 4.0 (very good) |
1 » | ||
Surface Topography: Metrology and Properties | 3.0 months |
3.7 months |
n/a | 3.0 | 5.0 | 5.0 | 2.0 | 5.0 (excellent) |
1 » | ||
IEEE Transactions on Instrumentation and Measurement | 0.9 months |
3.8 months |
n/a | 3.0 | 4.0 | 4.0 | 3.0 | 4.0 (very good) |
1 » | ||
Vacuum | 0.2 months |
0.2 months |
n/a | 1.0 | 5.0 | 3.0 | 2.0 | 5.0 (excellent) |
1 » | ||
Journal of Synchrotron Radiation | 3.9 months |
4.2 months |
n/a | 1.0 | 4.0 | 1.0 | 2.0 | 3.0 (good) |
1 » | ||
Spectrochimica Acta, Part B: Atomic Spectroscopy | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Journal of Automated Methods and Management in Chemistry | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Measurement and Control | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Sensing and Imaging | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Instrumentation Science and Technology | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Journal of Thermal Science and Technology | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Powder Diffraction | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Flow Measurement and Instrumentation | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Microscopy Research and Technique | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Accreditation and Quality Assurance | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Spectroscopy Europe | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Journal of Electron Microscopy | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Instruments and Experimental Techniques | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Journal of X-Ray Science and Technology | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
IET Microwaves, Antennas & Propagation | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Mikrokosmos | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Applied Spectroscopy | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Journal of Instrumentation | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Measurement Science Review | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Sensors and Materials | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Laser Physics | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
IEEE Instrumentation and Measurement Magazine | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Applied Spectroscopy Reviews | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Journal of Laser Applications | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Measurement Techniques | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Solid State Nuclear Magnetic Resonance | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
International Journal of Optomechatronics | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » | ||
Laser Physics Letters | n/a | n/a | n/a | n/a | n/a | n/a | n/a | n/a | 0 » |